From the source
From the source
LG AI Research, in collaboration with LG Innotek and LG Electronics, developed an unsupervised anomaly detection method for vision inspection of PCB substrates, achieving higher accuracy than supervised methods and nearing commercialization.
From the source
Joint research by researchers from LG AI Research, LG Innotek (Manufacturing Technology Division) and LG Electronics (Production Engineering. Research Institute) was carried out to apply AI technology to defect inspections. The new AI technology, including Self-supervised Representation Learning, were applied to strengthen the standard of inspection.
lgresearch.ai
